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Cover of: Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California | IEEE International Workshop on Memory Technology, Design, and Testing (1994 San Jose, Calif.) Read Online
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Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

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Published by IEEE Computer Society Press in Los Alamitos, Calif .
Written in English

Subjects:

  • Semiconductor storage devices -- Testing -- Congresses,
  • Random access memory -- Congresses

Book details:

Edition Notes

Statementedited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.
ContributionsRajsuman, Rochit., IEEE Computer Society. Test Technology Technical Committee., IEEE Computer Society. Technical Committee on VLSI.
Classifications
LC ClassificationsTK7895.M4 I334 1994
The Physical Object
Paginationix, 141 p. :
Number of Pages141
ID Numbers
Open LibraryOL1130261M
ISBN 10081866245X, 0818662468
LC Control Number94075844

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